A research collaboration between Osaka University and the Nara Institute of Science and Technology for the first time used scanning tunneling microscopy (STM) to create images of atomically flat side-surfaces of 3-D silicon crystals. This work helps semiconductor manufacturers continue to innovate while producing smaller, faster, and more energy-efficient computer chips for computers and smartphones.

Via:: https://phys.org/news/2017-10-image-perfectly-smooth-side-surfaces-d.html

Researchers image perfectly smooth side-surfaces of 3-D silicon crystals with a scanning tunneling microscope

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